PRESENTATION

PANEL SESSION

Paper Title: Hardware-in-the-Loop Testing for Microgrids: Closing the Gap Between Design and Energization
Presenter: Kurtis Toews, Senior Technical Sales Engineer, RTDS Technologies Inc.

As microgrids increasingly rely on inverter-based resources (IBRs), designing protection and control systems that are reliable has become more complex. This is specifically true for the islanded operation, when there's no grid support to rely on. The behavior of IBRs is highly dependent on their control modes, often resulting in nontraditional characteristics that challenge conventional protection and control schemes. The Hardware-in-the-Loop (HIL) testing approach allows engineers to simulate realistic conditions, observe system responses, and refine the design before the microgrid system goes live. It also reduces commissioning risk and improves long-term performance across a range of microgrid types.
 
This panel brings together voices from utilities, academia, and industry to highlight why HIL testing is becoming essential in microgrid design. Panelists will share lessons learned from real-world implementations across utility-scale, campus, and community projects, focusing on challenges, practical workarounds, and evolving best practices. If you're a utility engineer, developer, vendor, or investor, this session offers actionable insight into how HIL testing is helping de-risk deployment and ensure protection schemes are ready for the realities of today’s microgrids.